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阳极氧化ZnO有源层TFT研究 研究的意义 研究的现状 Zn-Al双层金属阳极氧化实验 器件方案
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研究的意义 器件的结构简单,我们可以才用选择性区域氧化,可以使用Zn作为电极,直接与Zn氧化成的半导体层ZnO相连
通过Zn-Al双层金属的阳极氧化可能探索出在阳极氧化中易溶金属的保护阳极氧化模式。 在低温条件下阳极氧化可能成非晶ZnO半导体层,可能制得性能良好的TFT器件。 通过合金阳极氧化的文献以及氧化的原理模式来分析双层金属阳极氧化的原理模式。
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研究的现状 Al保护双层金属阳极氧化的研究 Ta-Al双层金属的阳极氧化 Zr-Al双层金属的阳极氧化
Zn离子在阳极氧化Al2O3膜中的移动和注入
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SEM images of cross fractures of the Ta-Al
bilayer by galvanostatic anodizing in 0.2 M H2C2O4 at 10 mA/cm2, potentiostatic anodizing at 53 Vand reanodizing in 0.5 M H3BO3to 310 V Mozalev A, Sakairi M, Takahashi H Journal of The Electrochemical Society, 2004, 151(11): F257-F268.MLA
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Schematic cross-sectional views (a)the Ta-Al bilayer anodized at 53 V, (b)the TA-1 film re-anodized to 310 V, (c)the TA-2 film reanodized to 310 V. Arrows drawn in the diagrams show the general ionic transport processes during the reanodizing. Mozalev A, Sakairi M, Takahashi H Journal of The Electrochemical Society, 2004, 151(11): F257-F268.MLA
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Transmission electron micrograph of an ultramicrotomed section of the AI-Zr bdayer whxch had been anodized to 150 V at 5 mA cm -2 m 0.1 M ammonium pentaborate solution at 25 ℃. Shimizu K, Kobayashi K, Skeldon P, et al. Anodic oxidation of zirconium covered with a thin layer of aluminium[J]. Thin Solid Films, 1997, 295(1):
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Schemauc diagram showing the general iomc transport processes during the oxide growth on the AI-Zr bilayer; the transport numbers of metal cation and oxygen ions m the respective oxides are displayed m the adjacent diagram. Shimizu K, Kobayashi K, Skeldon P, et al. Anodic oxidation of zirconium covered with a thin layer of aluminium[J]. Thin Solid Films, 1997, 295(1):
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Initial formation of an essentially pure alumina film with accumulation of zinc atoms in a thin layer of alloy at the alloy/film interface. (b) Incorporation of zinc ions into the anodic film begins at discrete sites along the alloy/film interface on sufficient accumulation of zinc atoms in the enriched layer of alloy. (c) Incorporation of zinc ions into the anodic film proceeds in the presence of a steady-state enriched layer of alloy. The zinc ions migrate outwards in the film about 2.3 times faster than A13+ ions.
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Zn-Al双层金属阳极氧化实验 Zn 溅射膜的参数提取 Zn的溅射条件: 衬底加热温度:室温 工艺气体:Ar/50,0.36Pa
功率:DC/50W 溅射时间: 提取的参数:生长厚度 生长速率 方块电阻
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Zn-Al双层金属阳极氧化实验 Zn-Al双层金属阳极氧化可行性分析实验 金属溅射条件: 衬底:氧化硅片 Zn厚度:60nm
Al靶材:纯铝 或者 Al合金 Al的厚度:100nm Zn和Al溅射条件:衬底加热温度:室温 工艺气体:Ar/50,0.36Pa 功率:DC/50W
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Zn-Al双层金属阳极氧化实验 结果分析 1、 XRD简单分析阳极氧化薄膜成分以及结晶度(结合Al氧化形成的Al2O3 的XRD图像)
实验标号 电解液 和电流密度 恒压电压 恒压时间 备注 #1 0.001mol/L柠檬酸 0.2~0.3mA./cm2 120V 1h #2 160V #3 200V #4 300V 结果分析 1、 XRD简单分析阳极氧化薄膜成分以及结晶度(结合Al氧化形成的Al2O3 的XRD图像) 2、 SEM切片图分析阳极氧化结果的分层情况
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器件方案 试验流程 条件 器件剖面 备注 溅射形成栅电极金属图形 溅射条件: 厚度: 连续溅射金属Zn和Al,形成有源层图形 阳极氧化
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试验流程 条件 器件剖面 备注 刻蚀形成阻挡层 碱性溶液刻蚀 溅射金属Ti,形成源漏图形
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